Measurement technology: for micro-nanometer devices
By: Contributor(s): Material type:
TextLanguage: English Publication details: Singapore John wiley & sons 2016Description: xii,329p. ill. cmISBN: - 9781118717967 (hbk)
- C21:(D), Q7
Textual
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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Textual
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Central Science Library | Central Science Library | C21:(D) Q7 (Browse shelf(Opens below)) | Available | SL1601208 |
Includes bibliographical references; Index 327-329p.
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Measurement technology: for micro-nanometer devices
APA
Zahang Wendong, Bao Haifei, Chou Xiujian, Ma Zongmin & Shi Tielin. (2016). Measurement technology: for micro-nanometer devices. Singapore: John wiley & sons.
Chicago
Zahang Wendong, Bao Haifei, Chou Xiujian, Ma Zongmin and Shi Tielin. 2016. Measurement technology: for micro-nanometer devices. Singapore: John wiley & sons.
Harvard
Zahang Wendong, Bao Haifei, Chou Xiujian, Ma Zongmin and Shi Tielin. (2016). Measurement technology: for micro-nanometer devices. Singapore: John wiley & sons.
MLA
Zahang Wendong, Bao Haifei, Chou Xiujian, Ma Zongmin and Shi Tielin. Measurement technology: for micro-nanometer devices. Singapore: John wiley & sons. 2016.
